衰减全反射附件
OPREX-ATR
产品介绍
衰减全反射附件
本附件利用衰减全反射原理,可以对液体、粉末、聚合物等样品进行快速、无损的红外光谱分析,且几乎无需样品制备。其工作原理是,红外光在与样品接触的ATR晶体界面发生全反射,产生的“倏逝波”会渗入样品表层。通过检测因样品吸收而衰减的反射光获得高质量的表面红外光谱。
本附件利用衰减全反射原理,可以对液体、粉末、聚合物等样品进行快速、无损的红外光谱分析,且几乎无需样品制备。其工作原理是,红外光在与样品接触的ATR晶体界面发生全反射,产生的“倏逝波”会渗入样品表层。通过检测因样品吸收而衰减的反射光获得高质量的表面红外光谱。
产品参数
| 入射角度 | 60° |
| 产品尺寸 | L100mm×W60mm×H40mm |
Attenuated Total Reflectance (ATR) Accessory
OPREX-ATR
PRODUCT INTRO
This accessory utilizes the principle of Attenuated Total Reflectance (ATR) to perform rapid, non-destructive infrared spectral analysis of samples such as liquids, powders, and polymers, with little to no sample preparation required. Its working principle is that an infrared beam undergoes total internal reflection at the interface of an ATR crystal in contact with the sample, creating an "evanescent wave" that penetrates the samples surface layer. High-quality surface infrared spectra are obtained by detecting the reflected light that has been attenuated by the samples absorption.